Three-dimensional potential analysis of radiation pressure exerted on a single microparticle

Keiji Sasaki*, Mitsuru Tsukima, Hiroshi Masuhara

*Corresponding author for this work

Research output: Contribution to conferencePaper

Abstract

A new method for observing a three-dimensional potential exerted on a single particle is proposed. A microparticle trapped by a focused Nd:YAG laser beam is irradiated with the evanescent field of a He-Ne laser under the total-internal reflection condition. The scattered light from the microparticle is detected by a quadrant photodiode, so that the differential outputs determine the position with nanometer resolution and the total intensity gives the separation distance between the quartz surface and the particle on the basis of the exponential dependence of the scattered evanescent-field intensity. Temporal fluctuation of the particle position resulting from the thermal Brownian motion is sequentially measured to obtain a histogram.

Original languageEnglish
Number of pages1
StatePublished - 1 Jan 1997
EventProceedings of the 1997 Conference on Quantum Electronics and Laser Science, QELS - Baltimore, MD, USA
Duration: 18 May 199723 May 1997

Conference

ConferenceProceedings of the 1997 Conference on Quantum Electronics and Laser Science, QELS
CityBaltimore, MD, USA
Period18/05/9723/05/97

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    Sasaki, K., Tsukima, M., & Masuhara, H. (1997). Three-dimensional potential analysis of radiation pressure exerted on a single microparticle. Paper presented at Proceedings of the 1997 Conference on Quantum Electronics and Laser Science, QELS, Baltimore, MD, USA, .