Three-dimensional morphology of a very rough interface formed in the soldering reaction between eutectic SnPb and Cu

H. K. Kim*, H. K. Liou, King-Ning Tu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

175 Scopus citations

Abstract

We have used scanning electron microscopy to study the interfacial morphology of the Cu-Sn compounds formed between a eutectic SnPb alloy and Cu at 200°C. A selective etching reveals the three-dimensional morphology of the Cu-Sn compounds. On the solder side, the compounds grow rapidly as big scallops and the interface becomes extremely rough as compared to the Cu side of the interface. In order to understand this rapid and extremely irregular growth of the Cu-Sn compounds, we propose that it is caused by the dissolution of Cu into the liquid solder and the coarsening of the scallop-type compounds by Ostwald ripening. The growth of the Cu-Sn compounds has a serious impact on solder joint rework in electronic packaging.

Original languageEnglish
Number of pages1
JournalApplied Physics Letters
Volume66
DOIs
StatePublished - 1 Dec 1995

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