Thermal stress evaluation of a PCRAM material Ge2Sb 2Te5

Kuan-Neng Chen*, L. Krusin-Elbaum, C. Cabrai, C. Lavoie, J. Sun, S. Rossnagel

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations
Original languageEnglish
Title of host publication21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006
Pages97-98
Number of pages2
DOIs
StatePublished - 21 Nov 2006
Event21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006 - Monteray, CA, United States
Duration: 12 Feb 200616 Feb 2006

Publication series

Name21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006
Volume2006

Conference

Conference21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006
CountryUnited States
CityMonteray, CA
Period12/02/0616/02/06

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