The stability of noise behavior in amorphous indium gallium zinc oxide thin film transistors under illumination

Chun Yi Chang, Ya-Hsiang Tai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In this paper, the effects of light illumination on the noise are rarely discussed. In order to find out the noise behavior of a-IGZO TFTs under light and its change owing to the induced instability, we investigate the noise spectrum density of the a-IGZO TFTs under illumination conditions.

Original languageEnglish
Title of host publication2015 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT 2015
EditorsY. Kuo
PublisherElectrochemical Society Inc.
Pages23-26
Number of pages4
Edition1
ISBN (Electronic)9781607685395
DOIs
StatePublished - 1 Jan 2015
Event2015 5th International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT 2015 - Lake Tahoe, United States
Duration: 14 Jun 201518 Jun 2015

Publication series

NameECS Transactions
Number1
Volume67
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference2015 5th International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT 2015
CountryUnited States
CityLake Tahoe
Period14/06/1518/06/15

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