The short-range order structure of a water-quenched Ni-12.5 at. pct Si alloy-a synchrotron x-ray diffuse scattering study

J. P. Anderson*, H. D. Chen, J. E. Epperson

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

A wide-angle X-ray diffuse scattering measurement of a water-quenched Ni-12.5 at. pct Si alloy single crystal was performed using synchrotron radiation. The Cowley-Warren short-range order (SRO) parameters and static displacement terms between atom pairs were obtained. The first seven SRO parameters were fitted in an 8000-atom model, from which it was deduced that no ordered γ′ domains existed in the water-quenched structure, but an enhancement of the C16 and C17 nearest-neighbor configurations did occur as compared to a completely random model. The C16 configuration is the basic structural unit of the L1 2 ordered structure, and the C17 may be thought of as a faulted variant thereof. These results were confirmed by performing equivalent SRO modeling in a 140,608-atom model. Silicon-silicon nearest neighbors show a repulsive strain of approximately 12 pct, while Ni-Ni pairs contract by less than 1 pct.

Original languageEnglish
Pages (from-to)769-777
Number of pages9
JournalMetallurgical Transactions A
Volume23
Issue number3
DOIs
StatePublished - 1 Mar 1992

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