The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

D. R. Islamov*, T. V. Perevalov, V. A. Gritsenko, V. Sh Aliev, A. A. Saraev, V. V. Kaichev, E. V. Ivanova, M. V. Zamoryanskaya, A. Chin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations

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Physics & Astronomy