An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.
|Number of pages||14|
|Journal||Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties|
|State||Published - 1 Jan 1986|