The indirect rate-distortion function of a binary i.i.d source

Alon Kipnis, Stefano Rini, Andrea J. Goldsmith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The indirect source-coding problem in which a Bernoulli process is compressed in a lossy manner from its noisy observations is considered. These noisy observations are obtained by passing the source sequence through a binary symmetric channel so that the channel crossover probability controls the amount of information available about the source realization at the encoder. We use classic results in rate-distortion theory to compute the rate-distortion function for this model as a solution of an exponential equation. In addition, we derive an upper bound on the rate distortion which has a simple closed-form expression and investigate the coding scheme that attains it. These expressions capture precisely the expected behavior of the rate-distortion function: the noisier the source observations, the smaller the reduction in distortion obtained from increasing the compression rate.

Original languageEnglish
Title of host publicationITW 2015 - 2015 IEEE Information Theory Workshop
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages352-356
Number of pages5
ISBN (Electronic)9781467378529
DOIs
StatePublished - 17 Dec 2015
EventIEEE Information Theory Workshop, ITW 2015 - Jeju Island, Korea, Republic of
Duration: 11 Oct 201515 Oct 2015

Publication series

NameITW 2015 - 2015 IEEE Information Theory Workshop

Conference

ConferenceIEEE Information Theory Workshop, ITW 2015
CountryKorea, Republic of
CityJeju Island
Period11/10/1515/10/15

Keywords

  • Binary source
  • Binary symmetric channel
  • Indirect rate distortion

Cite this

Kipnis, A., Rini, S., & Goldsmith, A. J. (2015). The indirect rate-distortion function of a binary i.i.d source. In ITW 2015 - 2015 IEEE Information Theory Workshop (pp. 352-356). [7360794] (ITW 2015 - 2015 IEEE Information Theory Workshop). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITWF.2015.7360794