The Impact of Layout Dependent Intrinsic Parasitic RLC on High Frequency Performance in 3T and 4T Multi-finger nMOSFETs

Jyh-Chyurn Guo, Jyun Rong Ou, Jinq Min Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Physics & Astronomy

Engineering & Materials Science