The Enhancement of Gate-Induced-Drain-Leakage (GIDL) Current in Short-Channel SOI MOSFET and its Application in Measuring Lateral Bipolar Current Gain β

Jian Chen, Fariborz Assaderaghi, Ping Keung Ko, Chen-Ming Hu

Research output: Contribution to journalArticle

67 Scopus citations

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Chemical Compounds

Engineering & Materials Science