The effect of grain boundaries on the electrical properties of zinc oxide-based varistor

Shr Nan Bai*, Tseung-Yuen Tseng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

The ac response of ZnO-based varistors was measured as a function of temperature and applied electric field. Conductivity-frequency measurements indicated that the grain boundaries of the ZnO varistors were amorphous. The device resistance was found to decrease as the temperature/applied field increased. This was attributed to deterioration of the insulating property of the grain boundaries due to generation of conduction carriers in the ZnO grains. As a large amount of these charge carriers passed through the grain boundaries, the ZnO varistors remarkably revealed a non-Debye characteristic that can be modeled by a capacitance to simulate the behavior of the grain boundaries.

Original languageEnglish
Pages (from-to)1073-1079
Number of pages7
JournalJournal of Electronic Materials
Volume21
Issue number11
DOIs
StatePublished - 1 Nov 1992

Keywords

  • Ac response
  • Grain boundary
  • ZnO varistor

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