Abstract
The ac response of ZnO-based varistors was measured as a function of temperature and applied electric field. Conductivity-frequency measurements indicated that the grain boundaries of the ZnO varistors were amorphous. The device resistance was found to decrease as the temperature/applied field increased. This was attributed to deterioration of the insulating property of the grain boundaries due to generation of conduction carriers in the ZnO grains. As a large amount of these charge carriers passed through the grain boundaries, the ZnO varistors remarkably revealed a non-Debye characteristic that can be modeled by a capacitance to simulate the behavior of the grain boundaries.
Original language | American English |
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Pages (from-to) | 1073-1079 |
Number of pages | 7 |
Journal | Journal of Electronic Materials |
Volume | 21 |
Issue number | 11 |
DOIs | |
State | Published - 1 Nov 1992 |
Keywords
- Ac response
- Grain boundary
- ZnO varistor