Testing retention flip-flops in power-gated designs

Hao Wen Hsu, Shih Hua Kuo, Wen Hsiang Chang, Shi Hao Chen, Ming Tung Chang, Chia-Tso Chao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

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Engineering & Materials Science