Testing process capability for one-sided specification limit with application to the voltage level translator

P. C. Lin*, W.l. Pearn

*Corresponding author for this work

Research output: Contribution to journalArticle

22 Scopus citations

Abstract

Process capability indices CPU and CPL have been widely used in the microelectronics manufacturing industry as capability measures for processes with one-sided specification limits. In this paper, the theory of statistical hypothesis testing is implemented for normal processes, using the uniformly minimum variance unbiased estimators of CPU and CPL. Efficient SAS computer programs are provided to calculate the critical values and the p-values required for making decisions. Useful critical values for some commonly used capability requirements are tabulated. Based on the test a simple but practical step-by-step procedure is developed for in-plant applications. An example on the voltage level translator manufacturing process is given to illustrate how the proposed procedure may be applied to test whether the process meets the preset capability requirement.

Original languageEnglish
Pages (from-to)1975-1983
Number of pages9
JournalMicroelectronics Reliability
Volume42
Issue number12
DOIs
StatePublished - 1 Dec 2002

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