Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs

Szu Pang Mu*, Yi Ming Wang, Hao Yu Yang, Chia-Tso Chao, Shi Hao Chen, Chih Mou Tseng, Tsung Ying Tsai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce ICs leakage power consumption by turning off idle devices with MTCMOS power switches. In this paper, we study the usage of coarse-grain MTCMOS power switches for both logic circuits and SRAMs, and then propose corresponding methods of testing stuck-open power switches for each of them. For logic circuits, a specialized ATPG framework is proposed to generate a longest possible robust test while creating as many effective transitions in the switch-centered region as possible. For SRAMs, a novel test algorithm is proposed to exercise the worstcase power consumption and performance when stuck-open power switches exist. The experimental results based on an industrial MTCMOS technology demonstrate the advantage of our proposed testing methods on detecting stuck-open power switches for both logic circuits and SRAMs, when compared to conventional testing methods.

Original languageEnglish
Title of host publication2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
Pages155-161
Number of pages7
DOIs
StatePublished - 1 Dec 2010
Event2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 - San Jose, CA, United States
Duration: 7 Nov 201011 Nov 2010

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
CountryUnited States
CitySan Jose, CA
Period7/11/1011/11/10

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