Test coverage optimization for large code problems

Ying-Dar Lin*, Chi Heng Chou, Yuan Cheng Lai, Tse Yau Huang, Simon Chung, Jui Tsun Hung, Frank C. Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Because running all previous tests for the regression testing of a system is time-consuming, the size of a test suite of the system must be reduced intelligently with adequate test coverage and without compromising its fault detection capability. Five algorithms were designed for reducing the size of test suites where two metrics, test's function reach ability and function's test intensity, were defined. Approaches to the algorithm CW-NumMin, CW-CostMin, or CW-CostCov-B are the safe-mode of test case selection with full-modified function coverage, while the CW-CovMax algorithm is of non-safe mode, which was performed under time restriction. In this study, the most efficient algorithm could reduce the cost (time) of a test suite down to 1.10, on the average, over the MPLS area of Cisco IOS.

Original languageEnglish
Title of host publicationProceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012
Pages215-220
Number of pages6
DOIs
StatePublished - 14 May 2012
Event26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012 - Fukuoka, Japan
Duration: 26 Mar 201229 Mar 2012

Publication series

NameProceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012

Conference

Conference26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012
CountryJapan
CityFukuoka
Period26/03/1229/03/12

Keywords

  • function reachability
  • regression testing
  • test case selection
  • test coverage
  • test intensity

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  • Cite this

    Lin, Y-D., Chou, C. H., Lai, Y. C., Huang, T. Y., Chung, S., Hung, J. T., & Lin, F. C. (2012). Test coverage optimization for large code problems. In Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012 (pp. 215-220). [6185125] (Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012). https://doi.org/10.1109/WAINA.2012.137