Temporal universal conductance fluctuations in RuO2 nanowires due to mobile defects

An Shao Lien*, L. Y. Wang, Chon-Saar Chu, Juhn-Jong Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Temporal universal conductance fluctuations (TUCF's) are observed in RuO2 nanowires at cryogenic temperatures. The fluctuations persist up to very high T∼10 K. Their root-mean-square magnitudes increase with decreasing T, reaching ∼0.2e2/h at T2 K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF's as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.

Original languageEnglish
Article number155432
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume84
Issue number15
DOIs
StatePublished - 17 Oct 2011

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