Temperature effect on read current in a two-bit nitride-based trapping storage flash EEPROM cell

Mu Yi Liu*, Yao Wen Chang, Nian Ki Zous, Ichen Yang, Tao Cheng Lu, Ta-Hui Wang, Wenchi Ting, Joseph Ku, Chih Yuan Lu

*Corresponding author for this work

Research output: Contribution to journalArticle

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Chemical Compounds

Engineering & Materials Science