TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits

Sung S.Y. Hsueh, Ryan H.M. Huang, Charles H.P. Wen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Soft error has become one of the most critical reliability issues for nano-scaled CMOS designs. Many previous works discovered that the pulse width due to a particle strike on the device increases with temperature, but its system-level effect has not yet been investigated with statistical soft-error-rate (SER). Therefore, in this paper, a combinational circuit (c17 from ISCAS'85) using a 45nm CMOS technology is f rst observed under different temperatures for SER. As a result, a SER increase (2.16X more) is found on c17 as the ambient temperature elevates from 25°C to 125°C. Second, along with growing design complexity, the operational temperatures of gates are distributed in a wide range and much higher than the ambient temperature in reality. Therefore, we are motivated to build a temperature-aware SSER analysis framework that integrates statistical cell modeling to consider the ambient temperature (Ta) and the temperature variation (Tv), simultaneously. Experimental result shows that our SSER analysis framework is highly eff cient (with multiple-order speed-ups) and accurate (with only <4% errors), when compared with Monte-Carlo SPICE simulation.

Original languageEnglish
Title of host publicationProceedings of the 15th International Symposium on Quality Electronic Design, ISQED 2014
PublisherIEEE Computer Society
Pages529-534
Number of pages6
ISBN (Print)9781479939466
DOIs
StatePublished - 1 Jan 2014
Event15th International Symposium on Quality Electronic Design, ISQED 2014 - Santa Clara, CA, United States
Duration: 3 Mar 20145 Mar 2014

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference15th International Symposium on Quality Electronic Design, ISQED 2014
CountryUnited States
CitySanta Clara, CA
Period3/03/145/03/14

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    Hsueh, S. S. Y., Huang, R. H. M., & Wen, C. H. P. (2014). TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits. In Proceedings of the 15th International Symposium on Quality Electronic Design, ISQED 2014 (pp. 529-534). [6783372] (Proceedings - International Symposium on Quality Electronic Design, ISQED). IEEE Computer Society. https://doi.org/10.1109/ISQED.2014.6783372