In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.
|Number of pages||6|
|Journal||Proceedings of the Asian Test Symposium|
|State||Published - 1 Dec 1996|
|Event||Proceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan|
Duration: 20 Nov 1996 → 22 Nov 1996