Synchronous sampling and SNR-based gain control in DS/CDMA systems

You Hsien Lin*, Shih Lin Lo, Wei Chi Lai, Ta Yang Juan, Terng-Yin Hsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Timing synchronization is an important component in a receiver designed to recover data form sampling digital waveform. A synchronous sampling recovery with dual correlator differential (DCD) based acquisition with effects of auto-gain controller (AGC) is proposed to achieve fast timing acquisition for direct sequence / code division multiple access (DS/CDMA) system over frequency-selective fading channel in this paper. It measures both received DCD difference power to determine the good sampling phase from an all-digital phase interpolator based multiphase generator. This solution can tolerate + 50ppm system clock offset (SCO) under frequency-selective fading channel. Hence, we not only to determine the good sampling phase fast, but also to arrive stable variable gain amplifier (VGA) with AGC controller in DS/CDMA system approaches.

Original languageEnglish
Title of host publication2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
DOIs
StatePublished - 28 Sep 2007
Event2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Hsinchu, Taiwan
Duration: 25 Apr 200727 Apr 2007

Publication series

Name2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers

Conference

Conference2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007
CountryTaiwan
CityHsinchu
Period25/04/0727/04/07

Keywords

  • Multiphase
  • Phase interpolator
  • Synchronization
  • Timing recovery

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    Lin, Y. H., Lo, S. L., Lai, W. C., Juan, T. Y., & Hsu, T-Y. (2007). Synchronous sampling and SNR-based gain control in DS/CDMA systems. In 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers [4239421] (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers). https://doi.org/10.1109/VDAT.2007.373229