Surface profiling measurement using varifocal lens based on focus stacking

Chen Liang Fan, Chun Jen Weng*, Yu Hsin Lin, Pi-Ying Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.

Original languageEnglish
Title of host publicationI2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference
Subtitle of host publicationDiscovering New Horizons in Instrumentation and Measurement, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781538622223
DOIs
StatePublished - 10 Jul 2018
Event2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 - Houston, United States
Duration: 14 May 201817 May 2018

Publication series

NameI2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings

Conference

Conference2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018
CountryUnited States
CityHouston
Period14/05/1817/05/18

Keywords

  • focus stacking
  • surface profiling
  • varifocal lens

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