Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation

Jerry C.Y. Ku, Ryan H.M. Huang, Louis Y.Z. Lin, Charles H.P. Wen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Multi-core machines enable the possibility of parallel computing in Automatic Test Pattern Generation (ATPG). With sufficient computing power, previously proposed parallel ATPG has reached near linear speedup. However, test inflation in parallel ATPG yet arises as a critical problem and limits its practicality. Therefore, we developed a parallel ATPG system that incorporates (1) concurrent interruption (CI), (2) ripple compaction (RC) and (3) fan-in-cone based fault ordering (FIC) to deal with such problem. Concurrent interruption aborts test generation on simultaneously detected faults by fault simulation. Ripple compaction combines tests for different faults while fan-in-cone based fault ordering strategically arranges the fault list to reduce the number of test generations and thus speeds up the ATPG process. According to our experiments, the proposed parallel ATPG system effectively reduces 11% pattern count and achieves ∼0% test inflation while maintaining an average of 6.5X speedup with no attenuation in fault coverage on experimental circuits.

Original languageEnglish
Title of host publication2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Proceedings
Pages664-669
Number of pages6
DOIs
StatePublished - 27 Mar 2014
Event2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Suntec, Singapore
Duration: 20 Jan 201423 Jan 2014

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014
CountrySingapore
CitySuntec
Period20/01/1423/01/14

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  • Cite this

    Ku, J. C. Y., Huang, R. H. M., Lin, L. Y. Z., & Wen, C. H. P. (2014). Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation. In 2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Proceedings (pp. 664-669). [6742967] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2014.6742967