Study on the interface thermal stability of metal-oxide-semiconductor structures by inelastic electron tunneling spectroscopy

Chih Feng Huang*, Bing-Yue Tsui, Pei Jer Tzeng, Lurng Shehng Lee, Ming Jinn Tsai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

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Physics & Astronomy