Abstract
This letter investigates the effects of hydrogen ion implantation on the characteristics of InGaN-based green resonant-cavity light-emitting diodes (RCLEDs). RCLEDs with ion implantation were fabricated by implanting hydrogen ion H+ in a selective area. The implanted region was used to form current-confinement layers due to an existing deep-level (∼ 512 nm, 2.4 eV). Superior directionality was also obtained because the selective area of p-GaN layer of RCLEDs with ion implantation provided a low refractive index. The light emission enhancement was due to the high current density increasing and the total reflection of the emission ray. The electroluminescence spectrum exhibited narrow full-width at half-maximum of 45 nm for the RCLEDs with ion implantation. The fiber-coupled power of RCLEDs with H+ implantation was 2.2 times greater than that of a similar structure without H+ implantation at an injection current of 20 mA.
Original language | English |
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Article number | 5404952 |
Pages (from-to) | 404-406 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 22 |
Issue number | 6 |
DOIs | |
State | Published - 15 Mar 2010 |
Keywords
- Hydrogention implantation
- InGaN
- Resonant-cavity light-emitting diode (RCLED)