Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits During EMC/ESD test

Sheng Fu Hsu*, Ming-Dou Ker

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Different types of board-level noise filters are evaluated for their effectiveness to improve the immunity of CMOS ICs against transient-induced latchup (TLU) under system-level electrostatic discharge (ESD) test. By choosing proper components in each noise filter network, the TLU immunity of CMOS ICs can be greatly improved. All the experimental evaluations have been verified in test chips with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. Some of such board-level solutions can be further integrated into the chip design to effectively improve TLU immunity of CMOS IC products.

Original languageEnglish
Title of host publication17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Pages533-536
Number of pages4
StatePublished - 21 Nov 2006
Event17th International Zurich Symposium on Electromagnetic Compatibility, 2006 - Singapore, Singapore
Duration: 27 Feb 20063 Mar 2006

Publication series

Name17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Volume2006

Conference

Conference17th International Zurich Symposium on Electromagnetic Compatibility, 2006
CountrySingapore
CitySingapore
Period27/02/063/03/06

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  • Cite this

    Hsu, S. F., & Ker, M-D. (2006). Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits During EMC/ESD test. In 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 (pp. 533-536). [1629679] (17th International Zurich Symposium on Electromagnetic Compatibility, 2006; Vol. 2006).