Study of Al-Ti/Si bi-layer as the recording media for write-once HD-DVD optical disks

Hung Chuan Mai, Tsung-Eong Hsien*, Shiang Yao Jeng, Chong Ming Chen, Jen Long Wang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Optimum structure for HD-DVD optical disks containing Al-Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 × 10-7 and modulation >0.6 were achieved at the writing power (Pw) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al-Ti layers and the formation of Al3.21Si0.47 crystalline phase is responsible for the signal recording in the disk samples.

Original languageEnglish
Pages (from-to)680-684
Number of pages5
JournalMaterials Chemistry and Physics
Volume113
Issue number2-3
DOIs
StatePublished - 15 Feb 2009

Keywords

  • Bi-layer recording structure
  • Microstructure
  • Signal properties
  • Write-once optical disk

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