Structural and electrical properties of conducting diamond nanowires

Kamatchi Jothiramalingam Sankaran, Yen Fu Lin, Wen-Bin Jian, Huang Chin Chen, Kalpataru Panda, Balakrishnan Sundaravel, Chung Li Dong, Nyan Hwa Tai*, I. Nan Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Scopus citations


Conducting diamond nanowires (DNWs) films have been synthesized by N2-based microwave plasma enhanced chemical vapor deposition. The incorporation of nitrogen into DNWs films is examined by C 1s X-ray photoemission spectroscopy and morphology of DNWs is discerned using field-emission scanning electron microscopy and transmission electron microscopy (TEM). The electron diffraction pattern, the visible-Raman spectroscopy, and the near-edge X-ray absorption fine structure spectroscopy display the coexistence of sp3 diamond and sp2 graphitic phases in DNWs films. In addition, the microstructure investigation, carried out by high-resolution TEM with Fourier transformed pattern, indicates diamond grains and graphitic grain boundaries on surface of DNWs. The same result is confirmed by scanning tunneling microscopy and scanning tunneling spectroscopy (STS). Furthermore, the STS spectra of current-voltage curves discover a high tunneling current at the position near the graphitic grain boundaries. These highly conducting regimes of grain boundaries form effective electron paths and its transport mechanism is explained by the three-dimensional (3D) Mott's variable range hopping in a wide temperature from 300 to 20 K. Interestingly, this specific feature of high conducting grain boundaries of DNWs demonstrates a high efficiency in field emission and pave a way to the next generation of high-definition flat panel displays or plasma devices.

Original languageEnglish
Pages (from-to)1294-1301
Number of pages8
JournalACS Applied Materials and Interfaces
Issue number4
StatePublished - 27 Feb 2013


  • diamond nanowire films
  • electron field emission
  • graphitic grain boundary
  • high resolution transmission electron microscopy
  • hopping transport
  • scanning tunneling spectroscopy

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