Statistical investigation on the variation behavior of low-temperature poly- Si TFTs for circuit simulation

Shih Che Huang*, Guo Feng Peng, Jyh Long Chern, Ya-Hsiang Tai

*Corresponding author for this work

Research output: Contribution to journalConference article

3 Scopus citations

Abstract

In this paper, the variation characteristics of LTPS TFTs are statistically investigated. A description is proposed to fit the variation behaviors, which the coefficient of determination is higher than 0.95, reflecting the validation of the model. Furthermore, the proposed models are used to simulate the performance of the differential pair.

Original languageEnglish
Pages (from-to)329-332
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume37
Issue number1
DOIs
StatePublished - 1 Jan 2006
Event44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, United States
Duration: 4 Jun 20069 Jun 2006

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