Statistical electro-thermal analysis with high compatibility of leakage power models

Huai Chung Chang*, Pei Yu Huang, Ting Jung Li, Yu-Min Lee

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.

Original languageEnglish
Title of host publicationProceedings - IEEE International SOC Conference, SOCC 2010
Pages139-144
Number of pages6
DOIs
StatePublished - 1 Dec 2010
Event23rd IEEE International SOC Conference, SOCC 2010 - Las Vegas, NV, United States
Duration: 27 Sep 201029 Sep 2010

Publication series

NameProceedings - IEEE International SOC Conference, SOCC 2010

Conference

Conference23rd IEEE International SOC Conference, SOCC 2010
CountryUnited States
CityLas Vegas, NV
Period27/09/1029/09/10

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