Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide

Keunwoo Kim, Jente B. Kuang, Fadi H. Gebara, Hung C. Ngo, Ching-Te Chuang, Kevin J. Nowka

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations
Original languageEnglish
Title of host publicationIEEE International SOI Conference
PublisherIEEE
DOIs
StatePublished - 2008

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