SPICE simulation model for field emission triode

Chih Wen Lu*, Chung Len Lee, J. M. Huang

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

2 Scopus citations

Abstract

In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.

Original languageEnglish
Pages62-66
Number of pages5
StatePublished - 1996
EventProceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC - St.Petersburg, Russia
Duration: 7 Jul 199612 Jul 1996

Conference

ConferenceProceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC
CitySt.Petersburg, Russia
Period7/07/9612/07/96

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