Spatial correlation extraction with a limited amount of measurement data

Shu Han Whi*, Bing Shiun Su, Yu-Min Lee, Chi Wen Pan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

With the advance of nanometer technologies, the process variations play important roles in integrated circuit designs. The conventional corner value timing analysis becomes less effective and grossly conservative. Given a limited amount of measurement silicon data and without any distribution assumptions, this work develops a spatial correlation estimation methodology with the bootstrap resampling technique to improve the extraction correctness of the spatial correlation. By constructing the confidence interval of the spatial correlation, the correlation between two path delays can be got, and the high coverage rate for the true spatial path delay correlation has been demonstrated from the experimental results.

Original languageEnglish
Title of host publicationProceedings of the 2nd Asia Symposium on Quality Electronic Design, ASQED 2010
Pages248-254
Number of pages7
DOIs
StatePublished - 17 Sep 2010
Event2nd Asia Symposium on Quality Electronic Design, ASQED 2010 - Penang, Malaysia
Duration: 3 Aug 20104 Aug 2010

Publication series

NameProceedings of the 2nd Asia Symposium on Quality Electronic Design, ASQED 2010

Conference

Conference2nd Asia Symposium on Quality Electronic Design, ASQED 2010
CountryMalaysia
CityPenang
Period3/08/104/08/10

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