Abstract
In this study, the authors used a soft-mold-induced self-construction method to fabricate three-dimensional patterns under microwave irradiation for 1 min. The authors estimated the actual pattern growth temperature using a fluorescence probe technique. The temperature at which pattern growth originated was, by necessity, higher than the glass transition temperature of the novolak resist. Electrostatic forces and surface tension effects under the electromagnetic field contributed significantly to the pattern growth, and the use of an antisticking agent allowed easy demolding.
Original language | English |
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Article number | 191901 |
Journal | Applied Physics Letters |
Volume | 90 |
Issue number | 19 |
DOIs | |
State | Published - 17 May 2007 |