SoC for COFDM wireless communications: Challenges and opportunities

Chen-Yi Lee*, Hsuan Yu Liu, Chien Ching Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Coded Orthogonal Frequency Division Multiplexing (COFDM) technology has been widely accepted in many communication systems due to both bandwidth efficiency and robustness to channel distortion. This opens a great of opportunities.for SoC society to deal with design complexity by exploiting benefits of giga-scale integration. In this paper, we'll first review the general design concept of COFDM systems and then highlight several key issues in SoC realization. Then a system-level design flow by taking into account both performance indices and hardware complexity will be introduced. Several core modules related to COFDM system will also be addressed to see how better solutions can he achieved, especially for wireless applications. Finally two case studies on WLAN and OFDM-UWB will be discussed to demonstrate our proposals as well as to provide some directions for further research.

Original languageEnglish
Title of host publication2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers
Pages67-70
Number of pages4
DOIs
StatePublished - 1 Oct 2007
Event2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Hsinchu, Taiwan
Duration: 26 Apr 200728 Apr 2007

Publication series

Name2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers

Conference

Conference2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006
CountryTaiwan
CityHsinchu
Period26/04/0728/04/07

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    Lee, C-Y., Liu, H. Y., & Lin, C. C. (2007). SoC for COFDM wireless communications: Challenges and opportunities. In 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers (pp. 67-70). [4027497] (2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers). https://doi.org/10.1109/VDAT.2006.258125