Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits

Ming Long Fan, Shao Yu Yang, Vita Pi Ho Hu, Yin Nien Chen, Pin Su*, Ching Te Chuang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

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