Single domain nonpolar (134̄0) ZnO on (114) LaAlO 3

Yen Teng Ho, Wei Lin Wang, Chun Yen Peng, Jr Sheng Tian, Yi Sen Shih, Tzu Chen Yen, Li Chang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


An unconventional nonpolar plane (134̄0) ZnO epitaxial film was grown on a 2-inch (114) LaAlO 3 (LAO) substrate by pulsed laser deposition. Reflection high energy electron diffraction (RHEED) patterns of the grown ZnO surface demonstrate single crystalline characteristics with the orientation inclined with the a-axis. Atomic force microscopy (AFM) shows that the grown ZnO film exhibits a stripe-like surface morphology with the longitudinal direction parallel to the c-axis. Cross-sectional transmission electron microscopy (TEM) with selected area electron diffraction (SAED) was used to characterize the microstructure and to determine the growth plane of ZnO grown film as (134̄0). In addition, XRD pole-figure measurements confirm the single domain growth of (134̄0) ZnO on (114) LAO. Room temperature photoluminescence spectra of the ZnO film measured across the substrate show the same near band edge emission peak at 3.29 eV, indicating that the nonpolar (134̄0) ZnO film has excellent uniform optical properties.

Original languageEnglish
Pages (from-to)114-116
Number of pages3
JournalPhysica Status Solidi - Rapid Research Letters
Issue number3
StatePublished - 1 Mar 2012


  • Domains
  • LaAlO
  • Non-polar ZnO
  • Pulsed laser deposition

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