Simultaneous phase retardation and optic axis measurements of A- and C-plates

Yung Hsun Wu; Yi-Hsin Lin; Hongwen Ren; Shin Tson Wu

doi:10.1889/1.2433615

Simultaneous phase retardation and optic axis measurements of A- and C-plates

Yung Hsun Wu^*, Yi-Hsin Lin, Hongwen Ren, Shin Tson Wu

^*Corresponding author for this work

Department of Photonics

Research output: Contribution to journal › Conference article › peer-review

Abstract

We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

Original language	English
Pages (from-to)	732-735
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	37
Issue number	1
DOIs	https://doi.org/10.1889/1.2433615
State	Published - 1 Dec 2006
Event	44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, United States Duration: 4 Jun 2006 → 9 Jun 2006

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title = "Simultaneous phase retardation and optic axis measurements of A- and C-plates",

abstract = "We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.",

author = "Wu, {Yung Hsun} and Yi-Hsin Lin and Hongwen Ren and Wu, {Shin Tson}",

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AU - Wu, Yung Hsun

AU - Lin, Yi-Hsin

AU - Ren, Hongwen

AU - Wu, Shin Tson

PY - 2006/12/1

Y1 - 2006/12/1

N2 - We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

AB - We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

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DO - 10.1889/1.2433615

M3 - Conference article

AN - SCOPUS:34547516887

VL - 37

SP - 732

EP - 735

JO - Digest of Technical Papers - SID International Symposium

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SN - 0097-966X

IS - 1

Y2 - 4 June 2006 through 9 June 2006

ER -

Simultaneous phase retardation and optic axis measurements of A- and C-plates

Abstract

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