We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.
|Number of pages||4|
|Journal||Digest of Technical Papers - SID International Symposium|
|State||Published - 1 Dec 2006|
|Event||44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, United States|
Duration: 4 Jun 2006 → 9 Jun 2006