Abstract
We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.
Original language | English |
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Pages (from-to) | 732-735 |
Number of pages | 4 |
Journal | Digest of Technical Papers - SID International Symposium |
Volume | 37 |
Issue number | 1 |
DOIs | |
State | Published - 1 Dec 2006 |
Event | 44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, United States Duration: 4 Jun 2006 → 9 Jun 2006 |