Simultaneous measurement of phase retardation and optic axis of a phase compensation film using an axially-symmetric sheared polymer network liquid crystal

Yung Hsun Wu*, Ju Hyun Lee, Yi-Hsin Lin, Hongwen Ren, Shin Tson Wu

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

A new method for simultaneously measuring the phase retardation and optic axis of a uniaxial compensation film is demonstrated using an axially-symmetric sheared polymer network liquid crystal (SPNLC). By overlaying a tested compensation film with a calibrated SPNLC cell between crossed polarizers, two dark spots are clearly observed in a CCD image. From the orientation direction and distance of these two spots, the optic axis and phase retardation value of the compensation film can be determined. This method is particularly useful for those optical systems whose optic axis and phase retardation are dynamically changing.

Original languageEnglish
Pages (from-to)7045-7051
Number of pages7
JournalOptics Express
Volume13
Issue number18
DOIs
StatePublished - 5 Sep 2005

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