Simulation-based functional test generation for embedded processors

Charles H.P. Wen*, Li C. Wang, Kwang Ting Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Deterministic functional test pattern generation has been a long-standing open problem, which is an important problem to be solved for both design verification and manufacturing testing. One key to develop a practical functional test pattern generation approach is to avoid the exponential growth of the test generation complexity in terms of the growth in design size. This work proposes a novel functional test generation approach where simulation results are used to guide the generation of additional tests. Our methodology avoids the complexity growth issue by converting some modules in a design into simpler and more efficient models. Then, these models are used to facilitate the actual test generation process. We develop two sets of techniques to achieve these conversions. One is called Boolean learning to be applied on random logic and the other is called arithmetic learning to be applied on datapath modules. We demonstrate the effectivenesses and discuss the limitations of these techniques through experiments on benchmark circuits. We validate the overall test generation methodology based on the OpenRISC 1200 microprocessor.

Original languageEnglish
Title of host publicationProceedings - Tenth Annual IEEE International High Level Design Validation and Test Workshop, HLDVT'05
Pages3-10
Number of pages8
DOIs
StatePublished - 1 Dec 2005
EventTenth Annual IEEE International High Level Design Validation and Test Workshop, HLDVT'05 - Napa Valley, CA, United States
Duration: 30 Nov 20052 Dec 2005

Publication series

NameProceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
Volume2005
ISSN (Print)1552-6674

Conference

ConferenceTenth Annual IEEE International High Level Design Validation and Test Workshop, HLDVT'05
CountryUnited States
CityNapa Valley, CA
Period30/11/052/12/05

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