Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns

Ching Wei Yang, Pin Su

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Fingerprint Dive into the research topics of 'Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science