Simulated annealing for sequential pattern detection and seismic applications

Kou Jen Huang, Kou-Yuan Huang, I. Chieh Chen, Luke K. Wang

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


Sequential pattern detection with simulated annealing (SA) is adopted to estimate parameters and detect lines, ellipses, hyperbolas type by type, and patterns by patterns in each type. The motivation of the sequential detection method is to deal with multiple patterns. The parameters of a pattern are formed as a vector and used as a state, and adjusted in SA. A sequential detection algorithm using SA to detect patterns is proposed. It detects one or a small number of patterns at each step. SA has the capability of the global minimization. The six parameters of patterns are adjusted sequentially step by step. The computation can converge efficiently. In the experiment, the result of sequential detection is better than that of synchronous detection in detecting a large number of patterns. In sequential detection, detection of one pattern at each step can have less computation time and good convergence in total detection than using two or more pattern detections. In simulated seismic data, SA is applied to detect the hyperbolas in the common depth point (CDP) gather. In real one-shot seismogram, SA is applied to detect lines of direct wave and hyperbolas of reflection wave. The results can show that the proposed method is feasible.

Original languageEnglish
Article number6877660
Pages (from-to)4849-4859
Number of pages11
JournalIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Issue number12
StatePublished - 1 Dec 2014


  • Ellipse
  • Hyperbola
  • Line
  • Parametric pattern detection
  • Seismic patterns
  • Sequential detection
  • Simulated annealing (SA)

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