Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

Chien Wen Huang, Nien Hua Lu, Chih Yen Chen, Cheng Feng Yu, Tsung Sheng Kao, Din Ping Tsai, Pei Wang

Research output: Contribution to journalConference articlepeer-review

Abstract

Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.

Original languageEnglish
Pages (from-to)146-150
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4923
DOIs
StatePublished - 5 Sep 2002
EventNano-Optics and Nano-Structures 2002 - Shanghai, China
Duration: 14 Oct 200218 Oct 2002

Keywords

  • Near-field scanning optical microscopy
  • Short tip
  • Tapping-mode
  • Tuning fork

Fingerprint Dive into the research topics of 'Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy'. Together they form a unique fingerprint.

Cite this