Selective epitaxial growth of GaInP by LP-MOCVD using ethyldimethylindium, trimethylindium, trimethylgallium and triethylgallium as group III sources

Shih Hsiung Chan*, Simon Ming Sze, Chun Yen Chang, Wei-I Lee

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The present experiments demonstrate the epitaxial growth (EG) and selective epitaxial growth (SEG) of GaInP by low-pressure metalorganic chemical vapor deposition (LP-MOCVD) using ethyldimethylindium (EDMI), trimethylindium (TMI), trimethylgallium (TMG) and triethylgallium (TEG) as group III sources. In epitaxial growth of GaInP, the Ga incorporation efficiency using TEG + EDMI is found to be lower than those using other combinations. Completely selective epitaxy using TEGa + EDMIn can be achieved at a growth temperature of 675°C and at a growth pressure of 40 Torr, while other combinations (TEG + TMI, TMG + TMI, and TMG + EDMI) can achieve SEG of GaInP at 650°C. High resolution double-crystal X-ray measurements are used to investigate the compositional variation in the selectively epitaxial-grown area.

Original languageEnglish
Pages (from-to)85-90
Number of pages6
JournalApplied Surface Science
Volume82-83
Issue numberC
DOIs
StatePublished - 2 Dec 1994

Fingerprint Dive into the research topics of 'Selective epitaxial growth of GaInP by LP-MOCVD using ethyldimethylindium, trimethylindium, trimethylgallium and triethylgallium as group III sources'. Together they form a unique fingerprint.

  • Cite this