Se-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode

Hsiang Chen*, Yih Min Yeh, Chuan Hao Liao, Chun Wei Lin, Chuan Haur Kao, Tien-chang Lu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

The reverse-bias operation of the InGaN light-emitting diode (LED) device can reveal device-reliability problems. This study uses optical characterization techniques, including surface temperature measurements, two-dimensional (2D) X-ray fluorescent (XRF) element analysis, 2D electroluminescence (EL) images processed by Matlab, and electrical measurements to visualize the current leakages around the metal contact of the device. Connections between the device performance and the reverse-bias EL current distribution have been established. This paper attributes the origin of the reverse-bias emission to a high electric field caused by weak structures during process variations. Hot electron-induced emissions due to a leakage current may be a mechanism of the reverse-bias emission. Furthermore, reverse-bias stress on the devices is performed on the LED devices to investigate reliability issues. The reverse-bias light emission is relevant to reliability problems because of its combination of optical characterization and electrical performance. These techniques provide a screening tool that will correlate device failures with the fabrication process for future industrial applications.

Original languageEnglish
Pages (from-to)42-46
Number of pages5
JournalMicroelectronic Engineering
Volume101
DOIs
StatePublished - 1 Jan 2013

Keywords

  • Electroluminescence
  • GaN LED
  • Hot electron
  • Leakage current
  • Optical characterization
  • Reverse bias

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