SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance

Ming-Dou Ker*, Wan Yen Lin, Cheng Cheng Yen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A new silicon controlled rectifier (SCR)-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance is proposed. The circuit function to detect positive or negative electrical transients during system-level electrostatic discharge (ESD) and electrical fast transient (EFT) tests has been verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level electrical transient disturbance events. The detection results can be cooperated with firmware design to execute system recovery procedures, therefore the immunity of microelectronic systems against system-level ESD or EFT tests can be effectively improved.

Original languageEnglish
Pages (from-to)71-78
Number of pages8
JournalMicroelectronics Reliability
Volume54
Issue number1
DOIs
StatePublished - 1 Jan 2014

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