Robust continuous-time mash delta sigma modulator

Yanchao Wang, Lukang Shi, Tao He, Yi Zhang, Chia-Hung Chen, Gabor C. Temes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A continuous time (CT) multi-stage noise-shaping (MASH) delta sigma modulator (DSM) with reduced quantization noise leakage is proposed. In this structure, the shaped quantization noise is extracted at an integrator output, and analog noise transfer function (NTF) variations can be cancelled at the MASH output. Therefore, the circuit is insensitive to NTF variations, and no complex digital calibration is needed. The residual quantization noise leakage caused by integrator non-idealities is shaped, and can easily be calibrated to relax the requirements of the integrators. The proposed MASH can use more aggressive NTF than a traditional one, and uses a simpler noise cancellation filter. Simulation results and theoretical analysis verify the effectiveness of this structure.

Original languageEnglish
Title of host publication2018 IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages310-313
Number of pages4
ISBN (Electronic)9781538673928
DOIs
StatePublished - 22 Jan 2019
Event61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018 - Windsor, Canada
Duration: 5 Aug 20188 Aug 2018

Publication series

NameMidwest Symposium on Circuits and Systems
Volume2018-August
ISSN (Print)1548-3746

Conference

Conference61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018
CountryCanada
CityWindsor
Period5/08/188/08/18

Keywords

  • ADC
  • CT delta sigma
  • Low noise leakage
  • Low power
  • MASH

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    Wang, Y., Shi, L., He, T., Zhang, Y., Chen, C-H., & Temes, G. C. (2019). Robust continuous-time mash delta sigma modulator. In 2018 IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018 (pp. 310-313). [8624017] (Midwest Symposium on Circuits and Systems; Vol. 2018-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2018.8624017