Retroactive terahertz displacement sensor in a standard 65nm CMOS technology

Richard Al Hadi, Yan Zhao, Yilei Li, Yuan Du, Mau-Chung Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In this paper we demonstrate a self coherent terahertz system implemented in a standard a 65 nm CMOS technology for displacement sensing application. We name this method retroactive detection since no additional terahertz components are required to operate. The device main operating frequency is 0.35 THz in continuous-wave mode and operates at room temperature.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
StatePublished - 16 Dec 2016
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Conference

Conference2016 Conference on Lasers and Electro-Optics, CLEO 2016
CountryUnited States
CitySan Jose
Period5/06/1610/06/16

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