Resistive Approach for Extraction of Bias-Dependent Parasitic Resistance, Mobility and Virtual Gate Length in GaN HEMT

Pragyey Kumar Kaushik*, Sankalp Kumar Singh, Ankur Gupta, Ananjan Basu, Edward Yi Chang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint Dive into the research topics of 'Resistive Approach for Extraction of Bias-Dependent Parasitic Resistance, Mobility and Virtual Gate Length in GaN HEMT'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science