Reply to “Comments on ‘Impact Ionization in GaAs MESFET'”

K. Hui, Chen-Ming Hu, P. George, P. K. Ko

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)81-82
Number of pages2
JournalIEEE Electron Device Letters
Volume12
Issue number2
DOIs
StatePublished - 1 Jan 1991

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