Reliability study on tri-gate nanowires poly-Si TFTs under DC and AC hot-carrier stress

Yung Chun Wu*, Hung Bin Chen, Li Wei Feng, Ting Chang Chang, Po-Tsun Liu, Chun Yen Chang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science

Physics & Astronomy